Oscillation-Based Test in Mixed-Signal CircuitsGloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, Jose Luis Huertas Díaz Springer Science & Business Media, 2007 M06 3 - 452 páginas Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits. |
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Otras ediciones - Ver todas
Oscillation-Based Test in Mixed-Signal Circuits Gloria Huertas Sánchez,Diego Vázquez García de la Vega,Adoración Rueda Rueda,Jose Luis Huertas Díaz Sin vista previa disponible - 2006 |
Oscillation-Based Test in Mixed-Signal Circuits Gloria Huertas Sánchez,Diego Vázquez García de la Vega,Adoración Rueda Rueda,Jose Luis Huertas Díaz Sin vista previa disponible - 2009 |
Oscillation-Based Test in Mixed-Signal Circuits Gloria Huertas Sánchez,Diego Vázquez García de la Vega,Adoración Rueda Rueda,Jose Luis Huertas Díaz Sin vista previa disponible - 2010 |
Términos y frases comunes
achieve amplifier amplitude analog analysis applied approach biquad block capacitor Chapter circuit circuitry coefficients comparator complex considered convert corresponding define depending described determine deviation DF approach DTMF elements equation error evaluation example experimental expressions extra fact fault feedback loop Figure filter fosc Frequency Hz function gain given Group hand Huertas implementation input Integrated International involved linear means measurements method mode modulator needed non-linear normal OBIST Observe obtained opamp operation oscillation amplitude oscillation conditions oscillation frequency oscillation parameters output pair particular performance poles possible practical predicted proposed region SAMPLE scheme shown in Fig shows signal simulation solution specific Step strategy structure switches swopamp Table technique tion tone transfer function valid
Pasajes populares
Página xiii - This has to be done in a manner that increases accessibility to provide core isolation and test resources access, but it might have a high cost in terms of area overhead, power wasting, performance degradation and/or noise and parasitic penalties. But neither moving from functional to structural testing nor incorporating BIST are trivial issues in what analog circuitry is concerned, and are still far from a wide acceptance by the designer community. This acceptance will depend on several factors...