Oscillation-Based Test in Mixed-Signal CircuitsGloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, Jose Luis Huertas Díaz Springer Science & Business Media, 2007 M06 3 - 452 páginas Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits. |
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Otras ediciones - Ver todas
Oscillation-Based Test in Mixed-Signal Circuits Gloria Huertas Sánchez,Diego Vázquez García de la Vega,Adoración Rueda Rueda,Jose Luis Huertas Díaz Sin vista previa disponible - 2006 |
Oscillation-Based Test in Mixed-Signal Circuits Gloria Huertas Sánchez,Diego Vázquez García de la Vega,Adoración Rueda Rueda,Jose Luis Huertas Díaz Sin vista previa disponible - 2009 |
Oscillation-Based Test in Mixed-Signal Circuits Gloria Huertas Sánchez,Diego Vázquez García de la Vega,Adoración Rueda Rueda,Jose Luis Huertas Díaz Sin vista previa disponible - 2010 |
Términos y frases comunes
a₁ acos Amplitude Deviations analog analog circuits Aosc applied bandpass biquad capacitor Chapter circuit circuitry clk1 clk2 closed-loop system coefficients complex poles configuration considered Ctest describing-function DF approach DF method discrete-time DTMF E-Circuit equation Etest evaluation extra fault coverage feedback loop Figure filter fosc frequency and amplitude Frequency Deviations Frequency Hz gain Group IEEE implementation Input Buffer Integrated J.L. Huertas measurements mixed-signal modulator non-linear block Normalized Oscillation OBIST OBT concept OBT scheme OBT strategy OBT technique OBT-OBIST obtained on-chip opamp operation mode operational amplifier oscilla Oscillation Amplitude oscillation conditions Oscillation Frequency Cosine oscillation parameters oversampling pair of complex SAMPLE samplingfosc second-order shown in Fig Sigma-Delta Modulator simulation sinusoidal sinusoidal steady SPECTRUM dBV start-up steady state analysis structure switches swopamp Table test mode tion transfer function unit circle valid Vázquez Vref
Pasajes populares
Página xiii - This has to be done in a manner that increases accessibility to provide core isolation and test resources access, but it might have a high cost in terms of area overhead, power wasting, performance degradation and/or noise and parasitic penalties. But neither moving from functional to structural testing nor incorporating BIST are trivial issues in what analog circuitry is concerned, and are still far from a wide acceptance by the designer community. This acceptance will depend on several factors...